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专利名称：Systems and methods for calibrating mass
spectrometers
发明人：David Rafferty,James Wylde,Michael
Spencer,Warren Mino
申请号：US14603017申请日：20150122公开号：US09299545B2公开日：20160329
专利附图：
摘要：Systems and methods are disclosed for calibrating mass spectrometers. Inaccordance with one implementation, a system comprises a calibrant chamber within a
housing of a mass spectrometer. The system also comprises a permeation tube enclosedwithin the calibrant chamber, wherein the tube contains a calibrant chemical that
continuously outgasses the calibrant chemical. The outgassed calibrant chemical may beintroduced to the mass spectrometer for analysis. The system may also comprise aheating block to control the temperature of the calibrant chemical. The system mayfurther comprise a valve that introduces a known amount of the calibrant chemical intothe calibrant chamber. In accordance with the present disclosure, systems and methodsare provided for calibrating a mass spectrometer abundance scale.
申请人：1st DETECT CORPORATION
地址：Austin TX US
国籍：US
代理机构：Finnegan, Henderson, Farabow, Garrett & Dunner LLP
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